Electrostatic discharge (ESD) poses a persistent threat to electronic systems, from individual semiconductor devices to complex assemblies. Robust testing protocols and mitigation strategies are ...
Of all of the component-level ESD tests available, the charged-device model (CDM) test is the closest to simulating real world events. CDM testing simulates ESD charging followed by a rapid discharge, ...
How ESD and EOS silently kill electronics and what you can do about it. How tiny static sparks bypass factory testing and subsequently cause critical field failures. The exact trace geometries and via ...
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